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Author: search.filters.author.Chanhom, A.Subject: search.filters.subject.AFM

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    Surface morphology and optical property of silver nanoparticle thin film prepared by electrostatic spray deposition
    (2010-02-05)
    Boonnuk, Y.
    ;
    Chanhom, A.
    ;
    Tunhoo, B.
    ;
    Thiwawong, T.
    ;
    Nukeaw, J.
    Silver nanoparticle thin films were deposited on glass substrates by electrostatics spray deposition. Electrostatic spray condition was optimized by varying distance between nozzle and substrate between 20 mm and 60 mm, deposition time was fixed at 5 minute. The surface morphology and optical properties of films were carried out by using Atomic Force Microscope (AFM), Field Emission Scanning Electron Microscopy (FE-SEM) and UV-Vis Spectrophotometer. The results is indicate that the surface morphology of silver nanoparticle thin film show the grain size of film near around 100 nm at distance between nozzle and substrate of 60 mm and the RMS roughness decreases from 9.59 nm to 2.35 nm when distance between nozzle and substrate was increased from 20 mm to 60 mm. The optical absorption spectra showed the main absorption peak at 436 nm. When the distance between the nozzle and the substrate raise, decrease in absorption has been observed. © (2010) Trans Tech Publications.
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    Study of PDMS compounds using the adhesion force determined by AFM force distance curve measurements
    (2010-02-05)
    Vanitparinyakul, S.
    ;
    Pattamang, P.
    ;
    Chanhom, A.
    ;
    Tunhoo, B.
    ;
    Thiwawong, T.
    The atomic force microscope(AFM) was used to perform surface force measurements in contact mode to investigate surface properties of model systems at the nanoscale. Three different Polydimethylsiloxane (PDMS) compounds were observed. The first consisted of pure PDMS, the second of PDMS blend with the nanoparticles Zinc Oxide(PDMS/ZnO) and the third of PDMS blend with the nanoparticles Zinc Oxide and toluene solvent(PDMS/ZnO/toluene), respectively. Surface morphology and the adhesion force were investigated by using atomic force microscopy. Force - distance curve measurement was performed in a contact mode, which used tip as silicon nitride. Moreover, we found a significantly different of the adhesion force when modified by nanoparticles ZnO and toluene solvent. © (2010) Trans Tech Publications.