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Author: search.filters.author.Tuantranont, AdisornSubject: search.filters.subject.Spin-coating

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    Size-dependent and spatial variations in the structural properties of spin-coated poly(Vinylidene Fluoride) films
    (2025-10-01)
    Sukjit, Peemases
    ;
    Munpiriyakul, Pimpaporn
    ;
    Tuantranont, Adisorn
    ;
    Lomas, Tanom
    ;
    Borthai, Pawantree
    The uniformity of structural properties in large spin-coated poly(vinylidene fluoride), or PVDF, films is crucial due to their widespread applications and thus requires careful investigations. In this study, variations in structural properties across PVDF films of different sizes and positions were examined. Thin PVDF films were fabricated by the spin-coating method onto rectangular substrates with lengths varying from 10 mm to 40 mm while maintaining a constant width of 10 mm. Three key characteristics – thickness, phase, and crystallinity – were characterized and analyzed. Two effects were investigated – the size-dependent effects, i.e., the property variations at a specific position due to the increasing film length, and the spatial effects, i.e., the property variations along distances from the film center within a film of a specific size. The average thickness of the fabricated film was in the range of 5.00 μm to 6.00 μm, while the crystalline size was in the range of 1.00 nm to 3.00 nm. For the size-dependent effects, at a specific position on the film, increasing the film length did not significantly affect the thickness; however, the phase of PVDF shifted toward a more chain-like β phase, while the crystalline size decreased. At the film center, the crystalline size decreased by 60.7% when the film size increased from the smallest to the largest. These changes resulted from four combined mechanisms: centripetal force, viscosity, evaporation rate, and shear force. For the spatial effects, in a film with a specific size, when the distance from the center increased, the thickness decreased, the phase remained β, and the crystalline size was smaller. For the largest 40 × 10 mm<sup>2</sup> film, the thickness and crystalline size decreased by 16.7% and 3.6%, respectively, from the center to the edge of the film. These trends were attributed to the three combined mechanisms: centripetal force, viscosity, and evaporation rate. The findings of this study provide critical insights into a deeper understanding of property variations in spin-coated PVDF films among both different film sizes and different positions on a film, which is essential for optimizing their applications.
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    Accuracy of swanepoel method in calculation of polymer film thicknesses
    (2021-08-01)
    Kesornkhup, Sarunrit
    ;
    Tuantranont, Adisorn
    ;
    Lomas, Tanom
    ;
    Sriprachuabwong, Chakrit
    ;
    Wasapinyokul, Kamol
    We studied the accuracy of the Swanepoel method in the calculation of thicknesses of spin-coated poly(methyl methacrylate) films with thicknesses up to 2500 nm. Their thicknesses were calculated by using the Swanepoel method and subsequently compared with the measured actual values. Results showed that both thicknesses followed identical trends where films with higher solution concentrations or slower spin-coating speeds were thicker. The relative difference between the Swanepoel and the actual thicknesses was explained through the thickness of the flat region where the interference of transmitted light occurred. For a film whose flat region was thinner or thicker than other features of the film, its Swanepoel thickness was lower or higher, respectively, than the actual average value. Errors of the Swanepoel thicknesses from the actual values were analysed to find their correlation with the film surface roughness and thickness. When the film roughness and thickness increased fivefold, the error increased threefold and 1.6 times, respectively, indicating that the effect of the film roughness was predominant. Mathematically, this effect was the result of the fact that when roughness increased, the interference pattern shrank, and hence the values deviated. For the effect of thickness, thicker films had higher roughness, and consequently higher errors. Errors of as low as 5% and 0.86% were observed for films with the roughness of less than 15 nm and those with the thickness of 1800 nm, respectively. This showed that the method can be used to calculate the thickness of μm-thick polymer films, with a good level of roughness, with satisfying accuracy.