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Subject: search.filters.subject.Conducted EMI emission

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    Power quality and electromagnetic interference noise problems of fluorescent lamp system to control systems
    (2014-01-01)
    Uyaisom, Chutipon
    ;
    Khan-Ngern, Werachet
    Energy savings by replacing to fluorescent lamps (T5) with electronics ballast instead of fluorescent lamps (T8) with magnetic ballast conventional type, how popular is because it can save energy up to 40%. However, such an approach would create a major problem, cause pollution power systems electrical power quality problems, electromagnetic interference or EMI noise. That would make the system controls such as communications systems, industrial automation, control systems, internet systems and other systems that use electricity. They require high investments and the quality of the electrical resistance details for the perishables life is short. This will create a major problem for e-waste that is toxic to humans and the environment. The effect of the fluorescent lamps set on the conducted EMI noise is referred to CISPR-15 standard and test setup is referred to CISPR-16 standard. The experiment results shown to good result of fluorescent lamps (T5) with electronics ballast in a energy saving efficiency up to 41.30% of fluorescent lamps (T8) with magnetic ballast conventional type and disadvantages of fluorescent lamps (T5) such as low power quality and high EMI noise problems. However, if you want to energy saving up to 15.22% of fluorescent lamps (T8) with magnetic ballast conventional. But, not generate power quality and EMI noise problems, should be used with fluorescent lamps (T8) with magnetic ballast low loss type.
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    The comparison of conducted EMI emission and electrical performances of lamps
    (2007-12-01)
    Uyaisom, C.
    ;
    Khan-ngem, W.
    This paper presents the comparison the conducted electromagnetic interference (EMI) emission of lamps. The test set has been gotten public favor that consists of typical lamps. The types of lamp, such as incandescent lamp (40 W), new compact fluorescent lamp or energy saving lamp or Lord-Ta-Keab in Thai (8 W), compact fluorescent lamp with magnetic core ballast (36 W), and compact fluorescent lamp with electronic ballast (36 W). The effect of lamps on the conducted EMI emission are compared to verify the effectiveness of electrical performance. The test setup is referred to the CISPR-16 standard. © 2007 IEEE.
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    The effect of impedance mismatch on the conducted EMI emission
    (2003-01-01)
    Thammasiriroj, W.
    ;
    Ruayariyasub, S.
    ;
    Khan-Ngern, W.
    ;
    Nitta, S.
    The paper proposes a process to predict and analyze conducted electromagnetic interference (EMI) emission using the impedance mismatch approach. Five steps of this process are introduced and analyzed. The impedance mismatch criterion is proposed based on current and voltage waveforms in the time domain. The impedance mismatch fixtures and EMI measured results show how the impedance ratio and conducted EMI emission are related. The work was done using a class E zero-voltage switching (ZVS) resonant inverter at various load conditions - unity, lagging and leading power factors. The experimental results show good agreement with simulated results, which are accomplished by the MATLAB program.
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    Power electronics laboratory on electromagnetic interference (EM) studies
    (2003-01-01)
    Khan-Ngem, Werachet
    This paper presents the simplified power electronics laboratory on conducted electromagnetic interference (EMI) based on the favorite and available tools and circuits. This laboratory is a part of power electronics subject on a third year undergraduate course. The aim of this laboratory is to introduce the effect of self-resonant frequency (SRF) of the passive components on conducted EMI. The switching characteristic of a switching device such as gate drive control, snubber circuit and parasitic of capacitors to ground are also included. Finally, students can have the concept of the EM1 diagnoses and analysis.
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    The study and analysis of the conducted EMI suppression on power MOSFET using passive snubber circuits
    (2002-01-01)
    Yaisom, C. U.
    ;
    Khamgern, W.
    ;
    Nitta, S.
    This paper presents the study and analysis of RCD, RLD, and RCD-RLD passive snubber circuits affect to the power losses and the suppression of the conducted EMI emission on the power MOSFET. The paper describes the snubber effects on dv/dt during turn-off period, di/dt during turn-on period, over voltage, spike voltage, power loss and the conducted EMI emission. The 100 watts -50 kHz buck converter is used in the simulation and the in experiment. The measured and simulated results of conducted EMI emission are compared to verify the effectiveness of the each snubber circuits.