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    Generation lifetime analysis of p-n junction x-ray detector
    (2010-07-30)
    Rujanapich, Poopol
    ;
    Poyai, Amporn
    ;
    Srithanachai, Itsara
    ;
    Pengpad, Putapon
    ;
    Hruanan, Charndet
    Operation lifetime of the X-ray detector is the major factor that defines cost of detector or the actual operation cost of the detector. The purpose of this paper is to study the possibility of operation lifetime extension of the silicon x-ray detector. The study of the device's carrier generation lifetime before and after device exposed to the X-ray for 4 and 150 second at 40, 55 as well as 70 keV were conducted in this paper. The 1 mm<sup>2</sup> p-n junctions were fabricated by boron implantation process into phosphorus doped silicon wafer. A commercial x-ray source for dentist was used to generate x-ray in these experiments. The carrier generation lifetime was calculated from current-voltage (I-V) and capacitance-voltage (C-V) characteristics. The results show that the carrier generation lifetime increased after 4 second of x-ray irradiation at all three energy conditions but decreased back close to the original value after continue exposed devices for another 150 second. However, the lowest point of the generation lifetime after 4 second of x-ray irradiation is depending on the level of energy used. The results also presented that the defects that caused by x-ray irradiation are manageable.
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    Indirect X-Ray detector panel using multiple cameras
    (2008-12-01)
    Hemtiwakorn, Khaisang
    ;
    Srisuk, Namthip
    ;
    Pintavirooj, Chuchart
    In this paper, the indirect X-ray-detector panel using an array of digital camera with an intensifying screen is designed. To assist the orientation process, the camera calibration was used to derive the information of how the individual camera is oriented. Salt & pepper noise was removed by the median filtering technique. The border of captured image was transformed and registered by using the template matching with cross correlation, and matrix transformation to obtain the registered images. Moreover, the weighted average technique was used to obtain a smooth image mosaic. Finally, Lambert- Beer law was applied to construct the final detector output. Result shows that the mosaic X-ray detector output is as comparable as that of the single X-ray detector. The panel junction smoothness of the detector output is acceptable and the resolution is significantly improved. © 2008 IEEE.