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Effects of indium on the intermetallic layer between low-Ag SAC0307-xIn lead-free solders and Cu substrate
(2016-05-25)
Kanlayasiri, Kannachai
;
Sukpimai, Kamtorn
This research has investigated the effects of indium on the intermetallic layer formation attributable to the reaction between low-Ag SAC0307-xIn lead-free solder and a Cu substrate, where x = 0, 0.5, 1.0, 1.5, 2.0, 2.5 and 3.0 wt%. This study has also examined the post-soldering and post-thermal aging interfacial layers. Morphology parameters were utilized to represent the shape of total intermetallic layer at the interface. The findings indicated that indium had no effect on the pre- and post-aging intermetallic layer overall thicknesses but lowered the Cu<inf>3</inf>Sn/Cu<inf>6</inf>Sn<inf>5</inf> thickness ratio; and that the concentrations of indium exhibited no influence over the post-soldering and post-thermal aging morphology parameter values. In the experiments, the morphology parameter value decreased with increase in the aging time. In addition, the suppression effect of indium on the growth of Cu<inf>3</inf>Sn layer was evident in the post-thermal aging stage with the growth inversely correlated to the indium content. Discussion on the suppression mechanism of indium on the Cu<inf>3</inf>Sn formation is also provided herein.
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Evolution of Intermetallic Compounds between Sn-0.3Ag-0.7Cu Low-silver Lead-free Solder and Cu Substrate during Thermal Aging
(2012-01-01)
Mookam, Niwat
;
Kanlayasiri, Kannachai
The growth, transformation, and lattice structure of intermetallic compounds formed between Sn-0.3Ag-0.7Cu lead-free solder and copper substrate were investigated. Dip soldering was used to initiate the reaction between the solder and substrate. An η-Cu <inf>6</inf>Sn <inf>5</inf> intermetallic phase possessing a hexagonal lattice structure was found at the as-soldered interface. Thermal aging at a number of conditions resulted in the formation of a Cu <inf>3</inf>Sn intermetallic phase between the Cu <inf>6</inf>Sn <inf>5</inf> layer and the copper substrate. e{open}-Cu <inf>3</inf>Sn with an orthorhombic lattice structure was found together with hexagonal Cu <inf>3</inf>Sn. Subsequently, the activation energies of the intermetallic phases were calculated and compared to results obtained from the literature. The comparison showed that good agreement existed between the findings from this study and literature data within a similar temperature range. © 2012 The Chinese Society for Metals.
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Effect of soldering condition on formation of intermetallic phases developed between Sn-0.3Ag-0.7Cu low-silver lead-free solder and Cu substrate
(2011-05-26)
Mookam, Niwat
;
Kanlayasiri, Kannachai
In this paper, effect of soldering time and temperature on formation of intermetallic compounds developed between Sn-0.3Ag-0.7Cu lead-free solder and copper substrate was investigated. Dip soldering was performed at 250, 270, and 290 °C with soldering time of 5, 10, 15, and 20 s. Either ε-Cu <inf>3</inf>Sn or η-Cu<inf>6</inf>Sn<inf>5</inf> intermetallic phase was found at the interface between the solder and the substrate depending on the soldering condition, i.e., soldering time and soldering temperature. ε-Cu<inf>3</inf>Sn was found only when the substrate was soldered at 250 °C for 5 and 10 s. At other soldering conditions, only η-Cu <inf>6</inf>Sn<inf>5</inf> was found at the interfacial zone. Crystal structure of ε-Cu<inf>3</inf>Sn intermetallic phase was orthorhombic, and it was hexagonal structure for η-Cu<inf>6</inf>Sn<inf>5</inf>. Transformation of the intermetallic phases was also discussed. © 2011 Elsevier B.V. All rights reserved.

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