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    Dielectric relaxation behavior of BaZrO3 ceramics at low temperature
    (2020-10-15)
    Pulphol, Phieraya
    ;
    Vittayakorn, Naratip
    ;
    Vittayakorn, Wanwilai
    ;
    Kolodiazhnyi, Taras
    Dielectric behavior of nominally pure BaZrO<inf>3</inf>, Sc-doped BaZrO<inf>3</inf> and Sc + Nb-co-doped BaZrO<inf>3</inf> ceramics is reported in this paper. Several dielectric anomalies are detected in the pure and Sc-doped BaZrO<inf>3</inf> in temperature interval of 2–700 K. The Arrhenius-type dielectric relaxation has activation energies ranging from ca. 10 meV–800 meV. Annealing in Ar atmosphere at 1200 °C alters the intensity of the dielectric loss peaks especially in the Sc-doped BaZrO<inf>3.</inf> In contrast, none of the dielectric relaxation anomalies were found in Sc + Nb-co-doped BaZrO<inf>3</inf>. It is proposed that at least some of the dielectric peaks originate from the proton dynamics which includes high temperature migration, intermediate-temperature rotation and low-temperature phonon-assisted proton tunneling.