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Author: search.filters.author.Yupapin, P. V.P.

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    Dynamic measurement of thin liquid film parameters using high-speed ellipsometry
    (1998-02-15)
    Yupapin, P. V.P.
    ;
    Chitaree, R.
    ;
    Palmer, A. W.
    ;
    Grattan, K. T.V.
    ;
    Weir, K.
    The feasibility of the measurement of dynamic, thin liquid film properties using an ellipsometer-based fibre-optic modulation technique is presented. The essence of this technique is that a dynamic measurement of film parameters such as refractive index and Fresnel reflection coefficients may be simultaneously and automatically made, from which the instantaneous changes of liquid film thickness may be characterized. Such a scheme is discussed where a measurement rate of 25 Hz has been used to illustrate the value of the system in the monitoring of spreading liquid films. © 1998 Elsevier Science S.A.
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    A study of polarizationâ⠬ maintaining fiber characteristics with applications to force and displacement sensing
    (1995-01-01)
    Yupapin, P. V.P.
    ;
    Weir, K.
    ;
    Grattan, K. T.V.
    ;
    Palmer, A. W.
    An experimental investigation of three different types of highly birefringent fiber sensor element configured as a force and a displacement sensor is described. From the coupling of power between the two eigenmodes, the magnitude of the force and the position of the coupling point can then be determined using ‘white‐light interferometric’ techniques. © 1995, Laser Institute of America. All rights reserved.
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    Photoelastic material characteristics based on the stress-induced effect for sensor application
    (1993-01-01)
    Yupapin, P. V.P.
    ;
    Kusamran, S.
    An investigation of the properties of photoelastic sensing materials via the stress-induced effect using an interferometric technique is presented. Sensing material properties such as stress relaxation, elastic limit, and its temperature dependency are investigated with a view to using such a material as a stress/pressure sensing device. © 1993 IOP Publishing Ltd.