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Measurement of linearity in THz-TDS
Author(s)
Withayachumnankul, Withawat
Ung, Benjamin S.Y.
Fischer, Bernd M.
Abbott, Derek
Date Issued
December 31, 2009
Type
Conference Paper
Abstract
This article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Pérot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity. © 2009 IEEE.
Citation
34th International Conference on Infrared Millimeter and Terahertz Waves Irmmw Thz 2009, 2009