An inverse technique for dielectric-property determination from reflection measurement in spatial domain

Mearnchu, J.; Torrungrueng, D.; Phongcharoenpanich, C.; Krairiksh, M.

doi:10.1109/APMC.2005.1606993

An inverse technique for dielectric-property determination from reflection measurement in spatial domain

Author(s)

Mearnchu, J.

Torrungrueng, D.

Phongcharoenpanich, C.

Krairiksh, M.

Date Issued

December 1, 2005

Type

Conference Paper

DOI

10.1109/APMC.2005.1606993

Abstract

An inverse technique by reflection measurement in spatial domain is proposed instead of frequency domain. A steepest descent algorithm is used for minimizing performance functions to obtain fast convergence. Comparison results of inverse technique in spatial domain provides good agreement to those obtained from frequency domain ones that shows the possibility to design a low cost dielectric-property determination system. ©2005 IEEE.

Citation

Asia Pacific Microwave Conference Proceedings APMC, 5, 2005