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LDPC decoder using pattern-dependent modified llr for the bit patterned media storage with written-in errors
Author(s)
Date Issued
October 29, 2012
Type
Article
Abstract
The written-in errors in bit patterned media recording (BPMR) system cause the erroneous bits during the writing process leading to the performance degradation. In this work, we propose the pattern-dependent modified log-likelihood ratio (LLR) usage in low-density parity check (LDPC) decoder to reduce the written-in errors and also improve the write margin. Unlike the existing works, LLR computed based on the input data patterns is used at the LDPC decoder for the cascaded written-in error channel (WEC) with the additive white Gaussian noise (AWGN) channel. The proposed LDPC decoder outperforms the one with conventional LLR in terms of both the write margin, when the SNR is fixed at 5.5 dB, and the performance of LDPC decoder. The SNR gain is about 0.2 dB at the BER of 10 -6. © 2012 IEEE.
Citation
IEEE Transactions on Magnetics, 48(11), 4606-4609, 2012