Silk's Texture Defect Detection by Wavelet Transform

Narkthewan, Athasart; Chitsakul, Kitiphol

Silk's Texture Defect Detection by Wavelet Transform

Author(s)

Narkthewan, Athasart

Chitsakul, Kitiphol

Date Issued

October 16, 2003

Type

Conference Paper

Abstract

At present, Thai textile industries still mostly employ an expert team as inspector in product quality control. This is a time consuming process and could provoke the human related errors, This research presents a novel technique to automatic detect and classify some deflections of texture of silks on a microcomputer. Based on the wavelet transforms, silk's images, size 256 × 256 pixels digitally collected were analyzed in three resolutions in which some kinds of deflection such as losing of weft, warp or holds appeared. The statistical method such as analysis of variance, ANOVA has been used to classify such deflects on images. The performances of the technique were verified by using simulated texture images and real scanned silk's images with some artificial deflects.

Citation

Proceedings of 41st Kasetsart University Annual Conference, 141-148, 2003