Repository logo
Communities & Collections
Research Outputs
Fundings & Projects
People
Statistics
New user? Click here to register.Have you forgotten your password?
  1. Home
  2. KMITL
  3. Publication
  4. The microstructure length scale of strain rate sensitivity in ultrafine-grained aluminum
Loading...
Thumbnail Image

The microstructure length scale of strain rate sensitivity in ultrafine-grained aluminum

Author(s)
Kammers, Adam D.
Wongsa-Ngam, Jittraporn
Langdon, Terence G.
Daly, Samantha
Date Issued
April 14, 2015
Type
Article
DOI
10.1557/jmr.2015.58
Abstract
The mechanical properties of ultrafine-grained aluminum produced by equal-channel angular pressing (ECAP) are strongly influenced by strain rate. In this work, an experimental investigation of local strain rate sensitivity as it relates to microstructure was performed using a combination of scanning electron microscopy and digital image correlation. Uniaxial tension tests were carried out at 200 °C and strain rates alternating between 2.5 × 10-5 s-1 and 3.0 × 10-3 s-1. The results demonstrate that the heterogeneous microstructure generated by ECAP has a strong effect on the microstructure scale strain rate sensitivity. Deformation centered at grain boundaries separating regions of banded microstructure exhibits the greatest strain rate sensitivity. Strain rate sensitivity is limited in deformation occurring in regions of microstructure composed of ultrafine grains separated by low-angle grain boundaries. The tensile specimens all failed by shear bands at 200 °C and at room temperature they failed by necking with little plastic deformation apparent outside of the neck.
Citation
Journal of Materials Research, 30(7), 981-992, 2015
Subjects

metal

nanostructure

scanning electron mic...

Metrics
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your Institution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Accessibility settings
  • Privacy policy
  • End User Agreement
  • Send Feedback