Detection of leaf apex and base by using contour and symmetry analysis

Abstract

This paper proposes a contour analysis method for automatic detection of leaf apex and base. The contour is investigated to determine the optimal pair of points that are possibly the apex and base. The results are then affirmed using a leaf symmetry analysis and post-processing. Experimental results show that the proposed method can detect apex and base with an accuracy of 85%, given a 5 mm distance error.