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Noise source impedance measurement in SMPS

Author(s)
Tarateeraseth, Vuttipon
See, Kye Yak
Canavero, Flavio G.
Date Issued
December 1, 2011
Type
Book Chapter
DOI
10.2174/978160805240011101010038
Abstract
An accurate measurement method to extract common mode (CM) and differential mode (DM) noise source impedances of a switched-mode power supply (SMPS) under operating condition is presented in this chapter. With a proper pre-measurement calibration process, the proposed method allows extraction of both the CM and the DM noise source impedances with very good accuracy. These noise source impedances come in handy to systematically design an electromagnetic interference filter for a SMPS with minimum hassle. © 2011 Bentham Science Publishers. All rights reserved.
Citation
Electromagnetic Interference Issues in Power Electronics and Power Systems, 38-56, 2011
Subjects

Calibration process

CM noise source imped...

Common mode chokes

Common mode inductors...

Conducted electromagn...

Conducted emissions

Coupling capacitors

Differential mode cho...

Differential mode ind...

Differential mode noi...

Direct clamping two-p...

DM noise source imped...

Equivalent series ind...

Equivalent series res...

Hilbert transform

Insertion loss (IL)

Linearization

Load termination impe...

Mutual inductance

Noise coupling mechan...

Noise source impedanc...

Noise source impedanc...

Noise termination imp...

Parasitic capacitance...

Parasitic inductances...

Power line impedances...

Reflection coefficien...

Reverse-recovery phen...

RF instruments

RF isolation

S-parameters

Scattering parameters...

Sensing probe

Small-signal perturba...

Switched-mode power s...

Vector network analys...

X-capacitors (X-caps)...

Y-capacitors (Y-caps)...

Metrics
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