Repository logo
Communities & Collections
Research Outputs
Fundings & Projects
People
Statistics
New user? Click here to register.Have you forgotten your password?
  1. Home
  2. KMITL
  3. Publication
  4. The Effect of Surface Leakage Current on Frequency Domain Spectroscopy of 22 kV OIP Bushing
Loading...
Thumbnail Image

The Effect of Surface Leakage Current on Frequency Domain Spectroscopy of 22 kV OIP Bushing

Author(s)
Rojanasunan, Warisanan
Chumpiboon, Komin
Udomluksananon, Patt
Jeenmuang, Siwakorn
Chancharoensook, Phop
Pattanadech, Norasage
Date Issued
January 1, 2024
Type
Conference Paper
DOI
10.1109/ICPADM61663.2024.10750667
Abstract
In this paper the dielectric response in frequency domain or frequency domain spectroscopy (FDS) is used to assess the effect of surface leakage current both from high voltage side and ground side on the FDS results of OIP bushings. The test object in this paper is a 22 kV OIP bushing which is out of service. The surface leakage current can be simulated using the copper tape as a bandage around the bushing core in several locations. From the FDS results, several parameters i.e., dissipation factor, capacitance, and capacitance ratio together with frequency scanning of capacitance and dissipation factor from many cases were investigated to get the fundamental knowledge of how to interpret the FDS result of OIP bushing.
Citation
Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials, 73-76, 2024
Subjects

condition assessment

frequency domain spec...

OIP bushing

surface leakage curre...

Metrics
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your Institution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Accessibility settings
  • Privacy policy
  • End User Agreement
  • Send Feedback