Repository logo
Communities & Collections
Research Outputs
Fundings & Projects
People
Statistics
New user? Click here to register.Have you forgotten your password?
  1. Home
  2. KMITL
  3. Publication
  4. Statistical process control with autocorrelated data using neural networks
Loading...
Thumbnail Image

Statistical process control with autocorrelated data using neural networks

Author(s)
Yuangyai, Chumpol
Abrahams, Rachel
Date Issued
October 24, 2011
Type
Conference Paper
DOI
10.1109/ICQR.2011.6031726
Abstract
Statistical Process Control (SPC) is widely used for monitoring the performance of processes in manufacturing. Traditional SPC methods require trained individuals to read data which results in slow and limited detection. Much research has been devoted into developing an online automated system for SPC, so that the abnormality can be detected quickly and corrected by the process operation. To build a system as such, artificial neural networks (ANN) are widely used as tools where complex patterns can be difficult to recognize. Many research projects involve using random data patterns for training and recognition of patterns for ANN/SPC applications. However, many manufacturing processes involve autocorrelated data, to determine the effect of autocorrelated data, green sand data was analyzed and a neural network was built and trained to analyze a number of out of control patterns. Overall, the network performed best for detecting larger mean shifts. © 2011 IEEE.
Citation
2011 IEEE International Conference on Quality and Reliability Icqr 2011, 283-287, 2011
Subjects

Autocorrelated Data

Neural Networks

Statistical Process C...

Metrics
Get Involved!
  • Source Code
  • Documentation
  • Slack Channel
Make it your own

DSpace-CRIS can be extensively configured to meet your needs. Decide which information need to be collected and available with fine-grained security. Start updating the theme to match your Institution's web identity.

Need professional help?

The original creators of DSpace-CRIS at 4Science can take your project to the next level, get in touch!

Built with DSpace-CRIS software - Extension maintained and optimized by 4Science

  • Accessibility settings
  • Privacy policy
  • End User Agreement
  • Send Feedback