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Improving forward current characteristics of diode by X-ray irradiation
Author(s)
Niemcharoen, Surasak
Srithanachai, Itsara
Ueamanapong, Surada
Poyai, Amporn
Date Issued
January 25, 2012
Type
Conference Paper
Abstract
These papers investigates the effect of X-ray on forward current characteristics of diode. The forward current of diode after X-ray irradiation energy 40 keV at the exposure time ranging 5, 10 second was increased, while 15 and 20 second was decreased. X-ray causes changing of the electrical characteristics of diode. Series resistance is the main factor for analyze on forward current characteristics. From the results, X-ray can improve performance of diode at the exposure time for 5 and 10 second. © (2012) Trans Tech Publications, Switzerland.
Citation
Advanced Materials Research, 433-440, 6713-6716, 2012