Loading...
Detection of leaf apex and base by using contour and symmetry analysis
Author(s)
Watchareeruetai, Ukrit
Ditthawibun, Matchima
Phanjan, Kriangkrai
Date Issued
February 8, 2016
Type
Conference Paper
Abstract
This paper proposes a contour analysis method for automatic detection of leaf apex and base. The contour is investigated to determine the optimal pair of points that are possibly the apex and base. The results are then affirmed using a leaf symmetry analysis and post-processing. Experimental results show that the proposed method can detect apex and base with an accuracy of 85%, given a 5 mm distance error.
Citation
Icsec 2015 19th International Computer Science and Engineering Conference Hybrid Cloud Computing A New Approach for Big Data Era, 2016