The local generation and recombination lifetime based on forward diode characteristics diagnostics

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dc.contributor.authorWeera Pengchan
dc.contributor.authorToempong Phetchakul
dc.contributor.authorAmporn Poyai
dc.date.accessioned2025-07-21T05:52:33Z
dc.date.issued2011-12-20
dc.identifier.doi10.1016/j.jcrysgro.2011.11.087
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/3235
dc.subjectCarrier lifetime
dc.subjectArrhenius plot
dc.subject.classificationIntegrated Circuits and Semiconductor Failure Analysis
dc.titleThe local generation and recombination lifetime based on forward diode characteristics diagnostics
dc.typeArticle

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