A New Mismatch Model of Temperature and Narrow Channel Width Dependence on Threshold Voltage of MOSFETs

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dc.contributor.authorAnucha Ruangphanit
dc.contributor.authorNatthaphon Sakuna
dc.contributor.authorSurasak Niemcharoen
dc.contributor.authorRangson Muanghlua
dc.date.accessioned2025-07-21T05:54:50Z
dc.date.issued2014-05-01
dc.identifier.doi10.4028/www.scientific.net/amr.931-932.984
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/4546
dc.subjectChannel length modulation
dc.subjectReverse short-channel effect
dc.subjectSpice
dc.subjectNegative-bias temperature instability
dc.subjectOverdrive voltage
dc.subject.classificationAdvancements in Semiconductor Devices and Circuit Design
dc.titleA New Mismatch Model of Temperature and Narrow Channel Width Dependence on Threshold Voltage of MOSFETs
dc.typeArticle

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