The Effect of Surface Leakage Current on Frequency Domain Spectroscopy of 22 kV OIP Bushing

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dc.contributor.authorRojanasunan, Warisanan
dc.contributor.authorChumpiboon, Komin
dc.contributor.authorUdomluksananon, Patt
dc.contributor.authorJeenmuang, Siwakorn
dc.contributor.authorChancharoensook, Phop
dc.contributor.authorPattanadech, Norasage
dc.date.accessioned2026-08-06T10:43:34Z
dc.date.available2026-08-06T10:43:34Z
dc.date.issued2024-01-01
dc.description.abstractIn this paper the dielectric response in frequency domain or frequency domain spectroscopy (FDS) is used to assess the effect of surface leakage current both from high voltage side and ground side on the FDS results of OIP bushings. The test object in this paper is a 22 kV OIP bushing which is out of service. The surface leakage current can be simulated using the copper tape as a bandage around the bushing core in several locations. From the FDS results, several parameters i.e., dissipation factor, capacitance, and capacitance ratio together with frequency scanning of capacitance and dissipation factor from many cases were investigated to get the fundamental knowledge of how to interpret the FDS result of OIP bushing.
dc.identifier.citationProceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials, 73-76, 2024
dc.identifier.doi10.1109/ICPADM61663.2024.10750667
dc.identifier.other2-s2.0-85211117196
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/14971
dc.sourceProceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials
dc.subjectcondition assessment
dc.subjectfrequency domain spectroscopy
dc.subjectOIP bushing
dc.subjectsurface leakage current
dc.titleThe Effect of Surface Leakage Current on Frequency Domain Spectroscopy of 22 kV OIP Bushing
dc.typeConference Paper

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