New current-voltage transferring device with different metals

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dc.contributor.authorKando, Masaaki
dc.contributor.authorPattanadech, Norasage
dc.date.accessioned2026-08-06T10:12:06Z
dc.date.available2026-08-06T10:12:06Z
dc.date.issued2015-09-01
dc.description.abstractA new concept of an electrical shunt with different materials (aluminum and copper) has been developed to be used as an alternative current measurement device. The device provides better current measurement characteristics compared with the conventional current measurement devices such as a shunt resistor with an ammeter or the multiple shunts consisting of molybdenum having a low temperature coefficient and a Rogowski coil with an integrated circuit. The currents in several electrical circuits have been measured using the developed current-voltage transferring device (CVTD) as voltages between the aluminum and copper elements. The measured voltages (V<inf>m</inf>) are proportional to measuring currents (I<inf>m</inf>), which is shown as the following the experimental equation V<inf>m</inf> [mV] =kI<inf>m</inf> [A], in which k is a coefficient depending on the configuration of the CVTD.
dc.identifier.citationIeej Transactions on Electrical and Electronic Engineering, 10(5), 603-604, 2015
dc.identifier.doi10.1002/tee.22124
dc.identifier.issn19314973
dc.identifier.other2-s2.0-84937675098
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/6393
dc.sourceIeej Transactions on Electrical and Electronic Engineering
dc.subjectCurrent
dc.subjectCurrent sensor
dc.subjectCurrent transformer
dc.subjectResistivity
dc.subjectRogowski coil
dc.subjectShunt resistor
dc.titleNew current-voltage transferring device with different metals
dc.typeLetter

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