Near-Infrared Light Detection of n-Type _-FeSi<sub>2</sub>/Intrinsic Si/p-Type Si Heterojunction Photodiodes at Low Temperatures

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dc.contributor.authorRyuhei Iwasaki
dc.contributor.authorKyohei Yamashita
dc.contributor.authorNathaporn Promros
dc.contributor.authorShota Izumi
dc.contributor.authorSuguru Funasaki
dc.contributor.authorMahmoud Shaban
dc.contributor.authorTsuyoshi Yoshitake
dc.date.accessioned2025-07-21T05:53:47Z
dc.date.issued2013-03-15
dc.identifier.doi10.1149/05006.0129ecst
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/3940
dc.subjectPhotocurrent
dc.subjectPhotodiode
dc.subjectSpecific detectivity
dc.subjectBiasing
dc.subject.classificationSemiconductor materials and interfaces
dc.titleNear-Infrared Light Detection of n-Type _-FeSi<sub>2</sub>/Intrinsic Si/p-Type Si Heterojunction Photodiodes at Low Temperatures
dc.typeArticle

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