Breakdown voltage investigation of fusion SiO2 optical coupler switch using Pockel effect model

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dc.contributor.authorSaktioto
dc.contributor.authorHanim, Nor Faridah
dc.contributor.authorPhing, Ho Sze
dc.contributor.authorFadhali, Mohamed
dc.contributor.authorYupapin, Preecha
dc.contributor.authorAli, Jalil
dc.date.accessioned2026-08-06T09:58:55Z
dc.date.available2026-08-06T09:58:55Z
dc.date.issued2009-11-20
dc.description.abstractThis paper describes a new model for the breakdown voltage of SiO <inf>2</inf> fiber coupler using the Pockel effect and empirical equation. The model is evaluated by using the coupling coefficient and the changes in the refractive index. We found that the breakdown voltage is in the order of 10 <sup>2</sup> volt correspond to coupling coefficient by the order of mm <sup>-1</sup>. Increasing the value of coupling coefficient between the electrodes leads to a reduction in the breakdown voltage. © 2009 SPIE.
dc.identifier.citationProceedings of SPIE the International Society for Optical Engineering, 7386, 2009
dc.identifier.doi10.1117/12.835898
dc.identifier.issn0277786X
dc.identifier.other2-s2.0-70449563317
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/2665
dc.sourceProceedings of SPIE the International Society for Optical Engineering
dc.subjectEmpirical equation
dc.subjectOptical switch
dc.subjectPockel effect
dc.subjectSingle mode fiber
dc.titleBreakdown voltage investigation of fusion SiO2 optical coupler switch using Pockel effect model
dc.typeConference Paper

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