Integration of discriminant analysis with Artificial neural networks to decision analytic framework for enhancing automated visual IC inspection accuracy

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dc.contributor.authorTossapol Kiatcharoenpol
dc.contributor.authorSakon Klongboonjit
dc.date.accessioned2026-05-08T19:26:17Z
dc.date.issued2026-2-3
dc.identifier.doi10.1016/j.eswa.2026.131356
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/20514
dc.publisherExpert Systems with Applications
dc.subjectIndustrial Vision Systems and Defect Detection
dc.subjectAdvancements in Photolithography Techniques
dc.subjectSurface Roughness and Optical Measurements
dc.titleIntegration of discriminant analysis with Artificial neural networks to decision analytic framework for enhancing automated visual IC inspection accuracy
dc.typeArticle

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