The defects analysis in CMOS fabrication by arrhenius activation energy technique

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dc.contributor.authorWeera Pengchan
dc.contributor.authorToempong Phetchakul
dc.contributor.authorAmporn Poyai
dc.date.accessioned2025-07-21T05:51:55Z
dc.date.issued2011-02-01
dc.identifier.doi10.1109/nems.2011.6017386
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/2894
dc.subjectp�n junction
dc.subjectLeakage (economics)
dc.subjectArrhenius plot
dc.subject.classificationIntegrated Circuits and Semiconductor Failure Analysis
dc.titleThe defects analysis in CMOS fabrication by arrhenius activation energy technique
dc.typeArticle

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