Digital Holography Technique for exposing Defect on Photovoltaic Cell

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dc.contributor.authorAbdullahi Bako
dc.contributor.authorBunyarit Voochaiyaphum
dc.contributor.authorPrathan Buranasiri
dc.date.accessioned2026-05-08T19:26:16Z
dc.date.issued2025-1-1
dc.description.abstractWe employed digital holography techniques to detect surface anomalies from photovoltaic cell. The approach allowed for precise spatial mapping of micro-crack features without requiring physical contact or electrical biasing compared to conventional methods.
dc.identifier.doi10.1364/fio.2025.jd1a.34
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/20503
dc.subjectDigital Holography and Microscopy
dc.subjectAdvanced Electron Microscopy Techniques and Applications
dc.subjectIntegrated Circuits and Semiconductor Failure Analysis
dc.titleDigital Holography Technique for exposing Defect on Photovoltaic Cell
dc.typeArticle

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