The effects of temperature and device demension of MOSFETs on the DC characteristics of CMOS inverter

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dc.contributor.authorA. Ruangphanit
dc.contributor.authorK. Kiddee
dc.contributor.authorA. Poyai
dc.contributor.authorY. Wongprasert
dc.contributor.authorS. Niemcharoen
dc.contributor.authorR. Muanghlua
dc.date.accessioned2025-07-21T05:53:03Z
dc.date.issued2012-05-01
dc.identifier.doi10.1109/ecticon.2012.6254337
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/3503
dc.subjectTemperature coefficient
dc.subject.classificationAdvancements in Semiconductor Devices and Circuit Design
dc.titleThe effects of temperature and device demension of MOSFETs on the DC characteristics of CMOS inverter
dc.typeArticle

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