Phase-shifting determination and pattern recognition using a modified Sagnac interferometer with multiple reflections

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dc.contributor.authorAbdullahi Usman
dc.contributor.authorApichai Bhatranand
dc.contributor.authorYuttapong Jiraraksopakun
dc.contributor.authorKhalid Sabo Muhammad
dc.contributor.authorPrathan Buranasiri
dc.date.accessioned2025-07-21T06:10:44Z
dc.date.issued2024-01-09
dc.identifier.doi10.1364/ao.511674
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/13263
dc.subjectAperture (computer memory)
dc.subjectNanometrology
dc.subject.classificationOptical measurement and interference techniques
dc.titlePhase-shifting determination and pattern recognition using a modified Sagnac interferometer with multiple reflections
dc.typeArticle

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