Convolutional Neural Network Models for Scattering Pattern Recognition of Scanning Electron Microscopy Images

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dc.contributor.authorManop Phankokkruad
dc.contributor.authorSirirat Wacharawichanant
dc.date.accessioned2025-07-21T06:00:08Z
dc.date.issued2018-07-01
dc.identifier.doi10.1109/csii.2018.00012
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/7561
dc.subject.classificationIndustrial Vision Systems and Defect Detection
dc.titleConvolutional Neural Network Models for Scattering Pattern Recognition of Scanning Electron Microscopy Images
dc.typeArticle

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