Investigation of optical characteristics of the evaporated Ta 2 O 5 thin films based on ellipsometry and spectroscopy

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dc.contributor.authorR. Prachachet
dc.contributor.authorP. Buranasiri
dc.contributor.authorM. Horprathum
dc.contributor.authorP. Eiamchai
dc.contributor.authorNone S.Limwichean
dc.contributor.authorV. patthanasettakul
dc.contributor.authorNone N.Nuntawong
dc.contributor.authorP. Chindaudom
dc.contributor.authorB. Samransuksamer
dc.contributor.authorT. Lertvanithphol
dc.date.accessioned2025-07-21T05:57:40Z
dc.date.issued2017-01-01
dc.identifier.doi10.1016/j.matpr.2017.06.140
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/6180
dc.subjectEllipsometry
dc.subjectSpectrophotometry
dc.subject.classificationSurface Roughness and Optical Measurements
dc.titleInvestigation of optical characteristics of the evaporated Ta 2 O 5 thin films based on ellipsometry and spectroscopy
dc.typeArticle

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