Local structure investigation of Indium Oxynitride thin films by X-ray absorption fine structure

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dc.contributor.authorK. Amnuyswat
dc.contributor.authorP. Thanomngam
dc.contributor.authorS. Sopitpan
dc.contributor.authorA. Sungthong
dc.contributor.authorS. Porntheeraphat
dc.contributor.authorJ. Nukeaw
dc.date.accessioned2025-07-21T05:51:09Z
dc.date.issued2010-01-01
dc.identifier.doi10.1109/inec.2010.5424773
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/2445
dc.subjectIndium nitride
dc.subjectIndium tin oxide
dc.subject.classificationGaN-based semiconductor devices and materials
dc.titleLocal structure investigation of Indium Oxynitride thin films by X-ray absorption fine structure
dc.typeArticle

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