IC chip marking inspection using FIR system

Simple item page
dc.contributor.authorWirat Khannakum
dc.contributor.authorKaset Sirisantisamrid
dc.date.accessioned2025-07-21T06:03:36Z
dc.date.issued2020-06-12
dc.identifier.doi10.1117/12.2573005
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/9477
dc.subjectNormalization
dc.subjectMachine Vision
dc.subjectConnected component
dc.subject.classificationIndustrial Vision Systems and Defect Detection
dc.titleIC chip marking inspection using FIR system
dc.typeArticle

Files

Collections

All