Effect of Annealing Temperature on Properties of Tin Oxide Films Prepared by Electrostatic Deposition Technique

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dc.contributor.authorKorakot Onlaor
dc.contributor.authorBenchapol Tunhoo
dc.contributor.authorThutiyaporn Thiwawong
dc.date.accessioned2025-07-21T06:04:29Z
dc.date.issued2021-01-01
dc.identifier.doi10.1016/j.matpr.2020.04.620
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/9959
dc.subjectTin oxide
dc.subjectField emission microscopy
dc.subjectDeposition
dc.subject.classificationGas Sensing Nanomaterials and Sensors
dc.titleEffect of Annealing Temperature on Properties of Tin Oxide Films Prepared by Electrostatic Deposition Technique
dc.typeArticle

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