NiO thickness measurement using a rectangular-type Sagnac interferometer as the material transport layer in a perovskite solar cell

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dc.contributor.authorAbdullahi Usman
dc.contributor.authorApichai Bhatranand
dc.contributor.authorYuttapong Jiraraksopakun
dc.contributor.authorKhalid Sabo Muhammad
dc.contributor.authorPrathan Buranasiri
dc.date.accessioned2025-07-21T06:11:04Z
dc.date.issued2024-03-18
dc.identifier.doi10.1364/ao.520596
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/13407
dc.subjectNon-blocking I/O
dc.subject.classificationPerovskite Materials and Applications
dc.titleNiO thickness measurement using a rectangular-type Sagnac interferometer as the material transport layer in a perovskite solar cell
dc.typeArticle

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