A merged magnetotransistor for 3-axis magnetic field measurement based on carrier recombination�deflection effect

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dc.contributor.authorChana Leepattarapongpan
dc.contributor.authorToempong Phetchakul
dc.contributor.authorNaritchaphan Penpondee
dc.contributor.authorPuttapon Pengpad
dc.contributor.authorArckom Srihapat
dc.contributor.authorWutthinan Jeamsaksiri
dc.contributor.authorEkalak Chaowicharat
dc.contributor.authorCharndet Hruanun
dc.contributor.authorAmporn Poyai
dc.date.accessioned2025-07-21T05:54:54Z
dc.date.issued2014-05-04
dc.identifier.doi10.1016/j.mejo.2014.03.016
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/4599
dc.subjectBiasing
dc.subjectCarrier lifetime
dc.subject.classificationMagnetic Field Sensors Techniques
dc.titleA merged magnetotransistor for 3-axis magnetic field measurement based on carrier recombination�deflection effect
dc.typeArticle

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