Improved Extraction of the Local Carrier Generation Lifetime from Forward Diode Characteristics

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dc.contributor.authorW. Pengchan
dc.contributor.authorToempong Phetchakul
dc.contributor.authorAmporn Poyai
dc.date.accessioned2025-07-21T05:52:22Z
dc.date.issued2011-10-01
dc.identifier.doi10.4028/www.scientific.net/amr.378-379.593
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/3124
dc.subjectDiffusion capacitance
dc.subjectCarrier lifetime
dc.subject.classificationIntegrated Circuits and Semiconductor Failure Analysis
dc.titleImproved Extraction of the Local Carrier Generation Lifetime from Forward Diode Characteristics
dc.typeArticle

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