A comparative study on omnidirectional anti-reflection SiO2 nanostructure films coating by glancing angle deposition

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dc.contributor.authorRattagan Prachachet
dc.contributor.authorMati Horprathum
dc.contributor.authorPitak Eiamchai
dc.contributor.authorSaksorn Limwichean
dc.contributor.authorChanunthorn Chananonnawathorn
dc.contributor.authorBenjarong Samransuksamer
dc.contributor.authorTossaporn Lertvanithphol
dc.contributor.authorPrathan Buranasiri
dc.contributor.authorPennapa Muthitamongkol
dc.contributor.authorsakoolkan Boonruang
dc.date.accessioned2025-07-21T05:59:37Z
dc.date.issued2018-02-23
dc.identifier.doi10.1117/12.2290056
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/7275
dc.subject.classificationOptical Coatings and Gratings
dc.titleA comparative study on omnidirectional anti-reflection SiO2 nanostructure films coating by glancing angle deposition
dc.typeArticle

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