Surface Roughness Measurement Application Using Multi-frame Techniques

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dc.contributor.authorTanaporn Leelawattananon
dc.contributor.authorWarawoot Thowladda
dc.contributor.authorSuphamit Chittayasothorn
dc.date.accessioned2025-07-21T05:56:07Z
dc.date.issued2015-08-01
dc.identifier.doi10.1109/ccats.2015.30
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/5296
dc.subjectSurface Metrology
dc.subjectAccuracy and precision
dc.subject.classificationOptical measurement and interference techniques
dc.titleSurface Roughness Measurement Application Using Multi-frame Techniques
dc.typeArticle

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