Yield Analysis Based on the Defect Analysis with Derivative Method

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dc.contributor.authorWarakorn Praepattharapisut
dc.contributor.authorWeera Pengchan
dc.contributor.authorToempong Phetchakul
dc.contributor.authorAmporn Poyai
dc.date.accessioned2025-07-21T05:56:12Z
dc.date.issued2015-08-01
dc.identifier.doi10.4028/www.scientific.net/amm.781.160
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/5304
dc.subjectDerivative (finance)
dc.subject.classificationIndustrial Vision Systems and Defect Detection
dc.titleYield Analysis Based on the Defect Analysis with Derivative Method
dc.typeArticle

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