Mutual information rough sets feature selection and classification for microarray data analysis

dc.contributor.authorOunsrimuang, Pimolrat
dc.contributor.authorBoonjing, Veera
dc.date.accessioned2026-08-06T10:09:20Z
dc.date.available2026-08-06T10:09:20Z
dc.date.issued2014-01-01
dc.description.abstractThe feature selection (FS) techniques aim to reduce the subset size of an original data set, which are retained in the most useful information by selecting the most informative feature instead of irrelevant or redundant features. The benefits of FS for classification analysis can reduce the input data, improved predictive accuracy, learned knowledge is that easily understood, and reduced execution time. Many approaches based on rough set theory up to now, have operated the dependency function for measuring the goodness of the feature. However, there is not tolerance to noisy or inconsistency data, especially on high dimensional data microarray data sets. Moreover, mostly relevant information could be invisible by using only information from a positive region but neglecting a boundary region, mostly relevant may be invisible. Therefore, this paper proposes the maximal positive region and minimal boundary region criterion, based on rough set and mutual information, which use the different values among the information contained in the positive region, and the information contained in the boundary region. The experimental results indicate that our proposed method can increase the classification accuracy. © 2014 Pushpa Publishing House, Allahabad, India.
dc.identifier.citationFar East Journal of Mathematical Sciences, 85(2), 129-149, 2014
dc.identifier.issn09720871
dc.identifier.other2-s2.0-84897131780
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/5632
dc.sourceFar East Journal of Mathematical Sciences
dc.subjectBoundary region
dc.subjectClassification
dc.subjectFeature selection
dc.subjectMutual information
dc.subjectPositive region
dc.subjectRough sets
dc.titleMutual information rough sets feature selection and classification for microarray data analysis
dc.typeArticle

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