Polarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer

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dc.contributor.authorAbdullahi Usman
dc.contributor.authorPachara Thonglim
dc.contributor.authorApichai Bhatranand
dc.contributor.authorSamuk Pimanpang
dc.contributor.authorPrathan Buranasiri
dc.date.accessioned2025-07-21T06:09:59Z
dc.date.issued2023-10-04
dc.identifier.doi10.1117/12.2678176
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/12873
dc.subjectNon-blocking I/O
dc.subjectBeam splitter
dc.subject.classificationTransition Metal Oxide Nanomaterials
dc.titlePolarization phase shifting for thickness measurement of NiO material transport layer using Sagnac interferometer
dc.typeArticle

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