Role of Cu Substitute in AgGaTe<sub>2</sub> in Structural Stabilities, Electronic Property, and High-Pressure Phase Transitions: A DFT Investigation

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dc.contributor.authorIyarat Ounrit
dc.contributor.authorSatchakorn Khammuang
dc.contributor.authorAnan Udomkijmongkol
dc.contributor.authorSirinee Thasitha
dc.contributor.authorAparporn Sakulkalavek
dc.contributor.authorKomsilp Kotmool
dc.date.accessioned2025-07-21T06:12:58Z
dc.date.issued2025-06-07
dc.identifier.doi10.1021/acs.jpcc.5c01608
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/14453
dc.subject.classificationChalcogenide Semiconductor Thin Films
dc.titleRole of Cu Substitute in AgGaTe<sub>2</sub> in Structural Stabilities, Electronic Property, and High-Pressure Phase Transitions: A DFT Investigation
dc.typeArticle

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