Automatic Temperature Analysis of an Image Sensor using an Application in a Semiconductor Industry

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dc.contributor.authorChanathip Wongsomboon
dc.contributor.authorNoppadol Maneerat
dc.contributor.authorJakkrit Thudthong
dc.contributor.authorSutikamon Sukasem
dc.contributor.authorKuniaki Yajima
dc.contributor.authorBundit Pasaya
dc.date.accessioned2025-07-21T06:11:17Z
dc.date.issued2024-05-01
dc.identifier.doi10.1109/iceast61342.2024.10553998
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/13543
dc.subjectSemiconductor Industry
dc.subject.classificationSensor Technology and Measurement Systems
dc.titleAutomatic Temperature Analysis of an Image Sensor using an Application in a Semiconductor Industry
dc.typeArticle

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