White Noise in silicon-based planar metal-semiconductor-metal photodiodes

dc.contributor.authorS. Khunkhao
dc.contributor.authorP. Nanthivatana
dc.contributor.authorS. Niemcharoen
dc.contributor.authorW. Titiroongruang
dc.contributor.authorK. Sato
dc.contributor.authorA. Ruangphanit
dc.contributor.authorN. Phongphanchanthra
dc.date.accessioned2025-07-21T05:49:45Z
dc.date.issued2008-05-01
dc.identifier.doi10.1109/ecticon.2008.4600554
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/1654
dc.subject.classificationIntegrated Circuits and Semiconductor Failure Analysis
dc.titleWhite Noise in silicon-based planar metal-semiconductor-metal photodiodes
dc.typeArticle

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