White Noise in silicon-based planar metal-semiconductor-metal photodiodes
| dc.contributor.author | S. Khunkhao | |
| dc.contributor.author | P. Nanthivatana | |
| dc.contributor.author | S. Niemcharoen | |
| dc.contributor.author | W. Titiroongruang | |
| dc.contributor.author | K. Sato | |
| dc.contributor.author | A. Ruangphanit | |
| dc.contributor.author | N. Phongphanchanthra | |
| dc.date.accessioned | 2025-07-21T05:49:45Z | |
| dc.date.issued | 2008-05-01 | |
| dc.identifier.doi | 10.1109/ecticon.2008.4600554 | |
| dc.identifier.uri | https://dspace.kmitl.ac.th/handle/123456789/1654 | |
| dc.subject.classification | Integrated Circuits and Semiconductor Failure Analysis | |
| dc.title | White Noise in silicon-based planar metal-semiconductor-metal photodiodes | |
| dc.type | Article |