An experimental investigation of P�N diode electrical characteristics by soft X-ray annealing method

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dc.contributor.authorItsara Srithanachai
dc.contributor.authorSurada Ueamanapong
dc.contributor.authorAmporn Poyai
dc.contributor.authorSurasak Niemcharoen
dc.contributor.authorPreecha P. Yupapin
dc.date.accessioned2025-07-21T05:52:21Z
dc.date.issued2011-09-29
dc.identifier.doi10.1016/j.optlastec.2011.09.012
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/3112
dc.subject.classificationSemiconductor materials and interfaces
dc.titleAn experimental investigation of P�N diode electrical characteristics by soft X-ray annealing method
dc.typeArticle

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