Dynamic measurement of thin liquid film parameters using high-speed ellipsometry

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dc.contributor.authorYupapin, P. V.P.
dc.contributor.authorChitaree, R.
dc.contributor.authorPalmer, A. W.
dc.contributor.authorGrattan, K. T.V.
dc.contributor.authorWeir, K.
dc.date.accessioned2026-08-06T09:50:11Z
dc.date.available2026-08-06T09:50:11Z
dc.date.issued1998-02-15
dc.description.abstractThe feasibility of the measurement of dynamic, thin liquid film properties using an ellipsometer-based fibre-optic modulation technique is presented. The essence of this technique is that a dynamic measurement of film parameters such as refractive index and Fresnel reflection coefficients may be simultaneously and automatically made, from which the instantaneous changes of liquid film thickness may be characterized. Such a scheme is discussed where a measurement rate of 25 Hz has been used to illustrate the value of the system in the monitoring of spreading liquid films. © 1998 Elsevier Science S.A.
dc.identifier.citationSensors and Actuators A Physical, 65(1), 19-22, 1998
dc.identifier.doi10.1016/S0924-4247(97)01642-7
dc.identifier.issn09244247
dc.identifier.other2-s2.0-0031996829
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/174
dc.sourceSensors and Actuators A Physical
dc.subjectDynamic measurements
dc.subjectHigh-speed ellipsometry
dc.subjectThin liquid films
dc.titleDynamic measurement of thin liquid film parameters using high-speed ellipsometry
dc.typeArticle

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