An Inverse Technique for Dielectric-Property Determination from Reflection Measurement in Spatial Domain

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dc.contributor.authorJ. Mearnchu
dc.contributor.authorD. Torrungrueng
dc.contributor.authorC. Phongcharoenpanich
dc.contributor.authorM. Krairiksh
dc.date.accessioned2025-07-21T05:48:31Z
dc.date.issued2006-03-22
dc.identifier.doi10.1109/apmc.2005.1606993
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/962
dc.subjectReflection
dc.subject.classificationMicrowave and Dielectric Measurement Techniques
dc.titleAn Inverse Technique for Dielectric-Property Determination from Reflection Measurement in Spatial Domain
dc.typeArticle

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