Measurement of linearity in THz-TDS

Simple item page
dc.contributor.authorWithayachumnankul, Withawat
dc.contributor.authorUng, Benjamin S.Y.
dc.contributor.authorFischer, Bernd M.
dc.contributor.authorAbbott, Derek
dc.date.accessioned2026-08-06T09:59:28Z
dc.date.available2026-08-06T09:59:28Z
dc.date.issued2009-12-31
dc.description.abstractThis article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Pérot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity. © 2009 IEEE.
dc.identifier.citation34th International Conference on Infrared Millimeter and Terahertz Waves Irmmw Thz 2009, 2009
dc.identifier.doi10.1109/ICIMW.2009.5324721
dc.identifier.other2-s2.0-72749094472
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/2837
dc.source34th International Conference on Infrared Millimeter and Terahertz Waves Irmmw Thz 2009
dc.titleMeasurement of linearity in THz-TDS
dc.typeConference Paper

Files

Collections

Research