Yield analysis by poisson yield model based on the defect analysis with derivative method

Simple item page
dc.contributor.authorW. Praepattharapisut
dc.contributor.authorW. Pengchan
dc.contributor.authorT. Phetchakul
dc.contributor.authorA. Poyai
dc.date.accessioned2025-07-21T05:54:54Z
dc.date.issued2014-05-01
dc.identifier.doi10.1109/ecticon.2014.6839864
dc.identifier.urihttps://dspace.kmitl.ac.th/handle/123456789/4598
dc.subjectPoisson's equation
dc.subjectDerivative (finance)
dc.subjectSemiconductor device modeling
dc.subject.classificationIndustrial Vision Systems and Defect Detection
dc.titleYield analysis by poisson yield model based on the defect analysis with derivative method
dc.typeArticle

Files

Collections

All